Development Mueller Matrix Ellipsometry

source：JRS Release time：2025-05-01

Out line

Typical Nanostructure Metrology

Critical Dimensions of E-beam Patterned Structures

Critical Dimensions of Nanopillars

Nano-Imprinted Structures

Last One: Characterization of periodic nano- structures by Spectroscopic Ellipsometry Next： Asymmetric Nano-Imprinted Structures

MORM

02-07Characterization of periodic nano- structures by Spectroscopic Ellipsometry

Characterization of periodic nano-structures by Spectroscopic Ellipsometry ……
Read more
02-07JRS 2018 annual celebration was held

JRS 2018 annual celebration was held grandly JRS Chairman: Mr. B……
Read more
03-30The Grand Opening Ceremony of JRS New Factory was Hold on 18th March

On March 18, 2021, the ancient town of Mudu, Suzhou was blessed with breeze ……
Read more

Product Consumer Electrics LCD Industry Solar Manufacturing Semiconductor New Energy Industry Information System
Support Support
News Company news Industry dynamic
About About JRS Course Honor
Contact Contact us

Add me on Wechat
Customer service

Tel：016-63954569

email：[email protected]

Address：No.9，Zhufeng Rd，Wuzhong District，Suzhou，Jiangsu，China

Copy Right@2018 Suzhou JieRuiSi Intelligent Technology Co.,Ltd. Copyright page Sue ICP 15049083-1